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		The Impact of Low-Holding-Voltage Issue in High-Voltage Cmos Technology andDesign of Latchup-Free Power-Rail Esd Clamp Circuit for Lcd Driver Ics by Ker, Ming-Dou lin, Kun-Hsien Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		on-Chip Esd Protection Design by Using Polysilicon Diodes in Cmos Process by Ker, Ming-Dou Chen, Tung-Sheng Wang, Tai-Ho Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Esd Protection Design on Analog Pin with Very Low Input Capacitance for High-Frequency Or Current-Mode Applications by Ker, Ming-Dou Chen, Tung-Yang Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Esd Protection Design to Overcome Internal Damage on Interface Circuits of a Cmos Ic with Multiple Separated Power Pins by Ker, Ming-Dou Chang, Chyh-Yih Chang, Yi-Shu Source: IEEE Transactions on Components and Packaging Technologies Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Investigation on Device Characteristic of Mosfet Transistor Placed Under Bond Pad for High Pin Count Soc Applications by Ker, Ming-Dou Peng, Jeng-Jie Source: IEEE Transactions on Components and Packaging Technologies Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Lateral Scr Devices with Low-Voltage High-Current Triggering Characteristics for Output Esd Protection in Submicron Cmos Technology by Ker, Ming-Dou Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design onLow-Leakage Diode String for Using InPower-Rail Esd Clamp Circuits in a 0.35-Um Silicide Cmos Process by Ker, Ming-Dou Lo, Wen-Yu Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Esd Protection Design for Mixed Voltage I/O Buffer with Substrate Triggered Circuit by Ker, Ming-Dou Hsu, Hsin-Chyh Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		on-Chip Esd Protection Design with Substrate-Triggered Technique for Mixed-Voltage I/O Circuits in Subquarter-Micrometer Cmos Process by Ker, Ming-Dou Chuang, Chien-Hui Lin, Kun-Hsien Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Scr Device with Dynamic Holding Voltage for on-Chip Esd Protection in A 0.25-Um Fully Salicided Cmos Process by Ker, Ming-Dou Chen, Zi-Ping Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Substrate Triggered Scr Device for on-Chip Esd Protection in Fully Silicided Sub-0.25-Um Cmos Process by Ker, Ming-Dou Hsu, Kuo-Chun Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Substrate-Triggered Esd Protection Circuit without Extra Process Modification by Ker, Ming-Dou Chen, Tung-Yang Source: Ieee Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Substrate-Triggered Technique for on-Chip Esd Protection Design in A 0.18-Um Salicided Cmos Process by Ker, Ming-Dou Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Esd Implantation for Subquarter-Micron Cmos Technology to Enhance Esd Robustness by Ker, Ming-Dou Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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