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Low-Frequency Noise in Single Growth Planar Separate Absorption, Grading, Charge, and Multiplication Avalanche Photodiodes by
  • An, Serguei
  • Deen, M. Jamal
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Low-Frequency Noise in Proton Damaged Ldd Mosfet'S by
  • Hardy, Timothy
  • Deen, M. Jamal
  • Murowinski, R. M
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Effects of Hot-Carrier Stress onPerformance ofLc-Tank Cmos Oscillators by
  • Naseh, Sasan
  • Deen, M Jamal
  • Marinov, Ognian
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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