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A Stochastic Wire-Length Distributio for Gigascale Integration (Gsi)Part I Derivation and Validation by
  • Davis, Jeffrey A
  • De, Vivek
  • Meindl, James D
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Stochastic Wire-Length Distribution for Giascale Integration (Gsi)-PartII Applications to Clock Frequency, Power Dissipation, and Chip Size Estimaton by
  • Davis, Jeffrey A
  • De, Vivek
  • Meindl, James D
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Full-Chip Subthreshold Leakage Power Prediction and Reduction Techniques for Sub-0.18-Um Cmos by
  • Narendra, Siva
  • De, Vivek
  • Borkar, Shekhar
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Dynamic Sleep Transistor and Body Bias for Active Leakage Power Control of Microprocessors by
  • Tschanz, James W
  • Narendra, Siva G
  • De, Vivek
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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