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Breakdown of Universal Mobility Curves in Sub-100 Nm Mosfets by
  • Kaya, Abidin
Source: Ieee Transactions on Nanotechnology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Robust and Universal Constant-Gm Circuit Technique. by
  • Duque-Carrillo, J.L
  • Carrillo, J.M
  • Ausin, J.L
  • Sanchez-Sinencio, E
Source: IET:IEE: Electronics Letters
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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