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		A Device Transfer Process Selectively Occupied Repeated Transfer Sort for Resource Saving Integration of Polymer Micro Optics Fabricated by Built in Mask Method by Yoshimura, Hana Arai, Yukihiko Asama, Kunihiko Source: IEEE Transactions on Components and Packaging Technologies Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Fast Algorithm for Optimum Syndrome Space Compression by Robinson, J. P Tung, Cheng-Hsien Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Storage-Based Built-In Test Pattern Generation Method for Scan Circuits Based on Partitioning and Reduction of A Precomputed Test Set by Pomeranz, I Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Bist-Based Test and Diagnosis of Fpga Logic Blocks by Abramovici, M Stroud, C. E Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A New Approach to Built-In Self-Testable Datapath Synthesis Based on Integer Linear Programming. by Takahashi, T Kim, H. B Ha, D. S Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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