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A Novel Dynamic Memory Celi with Internal Voltage Gain by
  • Luk, Wing K
  • Dennard, Robert H
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
onAccuracy of Generation lifetime Measurement in High-Resistivity Silicon Using Pn Gated Diodes by
  • Isaacson, Michael
  • Betta, R. A. Dalia
  • Soncini, G
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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