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		Breakdown Process Experiments of Cap-and-Pin Insulators and Their Emt Leader Progression Model Implementation by Koehler, Fabian Peesapati, Vidyadhar Swingler, Jonathan Source: IET Generation, Transmission and Distribution Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Hole Traps in Silicon Dioxides-Part I: Properties by Zhang, Jian F Zhao, Ce Z Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Analog Circuits in Ultra-Deep-Submicron Cmos by Annema, Anne-Johan Nauta, Bram Source: Ieee Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A New Horison for System Protection Schemes by Lachs, W. R Source: Ieee Transactions on Power Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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