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A New Look at Impact Ionization Part II Gain and Noise in Short Avalanchephotodiodes by
  • Yuan, P
  • Hu, C
  • Anselm, K.A
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Equivalent Junction Method to Predict 3-D Effect of Curved-Abrupt P-N Junctions by
  • He, J
  • Xi, X
  • Chan, M
  • Hu, C
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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