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Distributed-Program Reliability Analysis: Complexity and Efficient Algorithms by
  • lin, M. S
  • Chang, M.S
  • Chen, D.J
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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A Cold-Cathode Flurescent Lamp Driver Circuit Wit Snchronous Primary-Side Dimming Control. by
  • Lin, M. S
  • Ho, W. J
Source: IEEE Transactions on Industrial Electronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Transport Phenomena During Resistance Spot Welding. by
  • Wei, P. S
  • Wang, S. C
  • Lin, M. S
Source: Transactions ofAsme, Journal of Heat Transfer
Material type: Article Article; Format: print
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