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Efficient Object-Oriented Integration and Regression Testing by
  • Traon, Yves Le
  • Morel, Pierre
  • Jezequel, Jean-Marc
  • Jeron, Thierry
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Impact of System Partitioning on Test Cost. by
  • Traon, Yves Le
  • Al-Hayek, Ghassan
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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