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onAccuracy of Generation lifetime Measurement in High-Resistivity Silicon Using Pn Gated Diodes by
  • Isaacson, Michael
  • Betta, R. A. Dalia
  • Soncini, G
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Earthquake-Induced Sloshing in Vertical Container of Arbitrry Section. by
  • Ryu, Chung-Son
  • Isaacson, Michael
Source: Asce: Journal of Engineering Mechanics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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