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Detailed Investigation of Geometrical Factor for Pseudo-Mos Transistor Technique by
  • Komiya, Kazuhito
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Metal Gate Work Function Engineering on Gate Leakage of Mosfets by
  • Hou, Y.-T
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A 90-Nm Logic Technology Featuring Strained-Silicon by
  • Thompson, S E
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Simple Approach to Fabrication of High-Quality Hfsion Gate Dielectrics with Improved Nmosfet Performances by
  • Wang, X
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Poly-Silicon Tft with A Sub-5-Nm Thick Channel for Low-Power Gain Cell Memory in Mobile Applications by
  • Ishii, T
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Nvm Characteristics of Single-Mosfet Cells Using Nitride Spacers with Gate-to-Drain Noi by
  • Hsieh, S.-C
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Silicon Heterojunction Solar Cell: A New Buffer Layer Concept with Low-Temperature Epitaxial Silicon by
  • Centurioni, E
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
onHigh-Temperature (to 300 Oc) Characteristics of Sige Hbts by
  • Chen, T
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Stable Threshold Voltage Extraction Using Tikhonov'S Regularization Theory by
  • Choi, W Y
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Nonvolatile Flash Memory Device Using Ge Nanocrystals Embedded in Hfaio High-K Tunneling and Control Oxides: Device Fabrication and Electrical Performance by
  • Chen, J. H
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Analysis and Optimization of Sdoi Structure to MaximizeIntrinsic Performance of Extremely Scaled Mosfets by
  • Zhang, Z
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Low-Cost Fully Self-Aligned Sige Bicmos Technology Using Selective Epitaxy and A Lateral Quasi-Single-Poly Integration Concept by
  • Tilke, A T
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A New Trench Bipolar Transistor for Rf Applications by
  • Hueting, Raymond J.E
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Thin-Film Strained-Soi Cmos Devices-Physical Mechanisms for Reduction of Carrier Mobility by
  • Sugiyama, N
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Device Design Methology for Sub-100-Nm Soc Applications Using Bulk and Soi Mosfets by
  • Suryagandh, S S
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Feature-Scale Process Simulation and Accurate Capacitance Extraction for Backend of A 100-Nm Aluminum/Teos Process by
  • Heitzinger, Clemens
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Impact Ionization Mos (I-Mos) Part Ii: Experimental Results by
  • Gopalakrishnan, K
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Investigation ofSource/Drain Asymmetric Effects Due to Gate Misalignment in Planar Doubl-Gate Mosfets by
  • Yin, C
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Optimization ofNonverlap Length in Decanano Mos Devices with 2-D Qm Simulations by
  • Gusmeroli, R
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
onConduction Mechanism in Polycrystalling Silicon Thin-Film Transistors by
  • Walker, A. J
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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