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Double-Island Single-Electron Devices a Useful Unit Device for Single-Electron Logic Asi'S by
  • Fujiwara, Akira
  • Takahashi, Yasuo
  • Murase, Kazuo
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Bulk Defect Induced Low-Frequency Noise in N P Silicon Diodes by
  • Hou, Fan-Chi
  • Simoen, Eddy
  • Claeys, C
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Opticaliy Induced Sidegating Current Isolation of Faas Mesfet by Multiquantum Barrier by
  • Lee, Ching Ting
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Negative Capacitance Effect in Semiconductor Devices by
  • Ershov, Maxim
  • Buchanan, M
  • Jonscher, andrew K
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Model for Drain Current of Deep Submicrometer Mosfet'S Including Electron-Velocity Overshoot by
  • Roldan, J B
  • Gamiz, F
  • Carcelier, J. E
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Compact Double-Gate Mosfet Model Comprising Quantum-Mecanical and Nonstatic Effects by
  • Baccarani, G
  • Reggiani, S
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Recent Advaces in Process Synthesis for Semiconductor Devices by
  • Hosack, Harold H
  • Mozumder, Purnendu K
  • Poliack, Gordon P
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Characteristics OfBase Coupled Insulated Gate Thyristor Experiment and Analytical Modeling by
  • Ajit, J. S
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Mos-Controlied High-Voltage Thyristor with Low Swithin Losses by
  • Hermansson, Wiliy
  • andersson, Karin
  • Sigurd, Dag
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Multimechanism Model for Photon Generation by Silicon Junctions in Avalanche Breakdown by
  • Akil, Nader
  • Kerns, Sherra E
  • Kerns, David V
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Enhanced Transmission line Model Structures for Accurate Resistance Evaluation of Smali-Size Contacts and for More Reliable Fabrication by
  • Sawdai, Donald
  • Pavlidis, Dimitris
  • Cui, Delong
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Depletion- and Enhancement-Mode Modulation-Doped Field-Effect Transistors for Ultrahigh-Speed Applications an Electrochemicali Fabrication Technology by
  • Xu, Dong
  • Suemitsu, T
  • Tamamura, Toshiaki
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Single-Mode Fiber Packaging for Semiconductor Optical Devices by
  • Mann, James W
  • Reith, Leslie A
Source: IEEE Transactions on Components Hybrids and Manufacturing Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Transient Thermal Study of Semiconductor Devices\ by
  • Lee, Chin C
  • Palisoc, Arthur L
  • Min, Y. Jay
Source: IEEE Transactions on Components Hybrids and Manufacturing Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Bcb-Bridged Distributed Wideband Spst Switch Using 0.25 Um in 0.5 As Metamorphic Hemts by
  • Lin, K. C
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
High-Voltage Normally off Gan Mosfets on Sapphire Substrates by
  • Matocha, K
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
ModelingElectrical Characteristics of Schottky Contacts in Low-Dimensional Heterostructure Devices by
  • Ragi, Regiane
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Modeling and Analysis of Znse-Ge Hbts by
  • Abdel-Motaleb, I M
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Hydrogen Sensitivity of Inp Hemts with Wsin-Based Gate Stack by
  • Mertens, Sander
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Velocity Overshoot Effects and Scaling Issues in Iii-V Nitrides by
  • Singh, M
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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