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Macroscopie Simulation of Quantum Mechanical Effects in Two-Dimensional Mos Devices ViaDensity Gradient Method by
  • Connelly, D
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Silicon Single-Electron Transistors with Sidewall Depletion Gates and Their Application to Dynamic Single-Electron Transistor Logic by
  • Kim, D
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Hot Carrier-Induced Degration of Gate Overlapped Lightly Doped Drain (Goldd) Polysilicon Tfts by
  • Valletta, A
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
The Design, Characterization, and Modeling of Rf Ldmosfets on Silicon-on-Insulator Material by
  • Mcshane, E
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Analytical Modeling of Quantization and Volume Inversion in Thin-Si-Film Dg Mosfets by
  • Ge, L
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Ultralow Resistance W/Poly-Si Gate Coms Technology Using Amorphous-Sitin Buffer Layer by
  • Wakabayashi, H
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A New Compact Dc Model of Floating Gate Memory Cells without Capacitive Coupling Coefficients by
  • Larcher, L
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Threshold Voltage Roll-Up/Roll-off Characteristic Control in Sub-0.2-Um Single Workfunction Gate Cmos for High-Performance Dram Applications by
  • Inaba, S
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
High-Frequency Small Signal Ac and Noise Modeling of Mosfets for Rf Ic Design by
  • Cheng, Y
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Effect of for ward and Reverse Substrate Biasing on Low-Frequency Noise in Silicon Pmosfets by
  • Deen, M.J
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Analysis on High-Frequency Characteristics of Soi Lateral Bjts with Self-Aligned External Base for 2-Ghz Rf Application by
  • Nii, H
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Dynamic Threshold Voltage Damascene Metal Gate Mosfet (Dt-Dmg-Mos) Technology for Very Low Voltage Operation of Under 0.7 V by
  • Yagishita, A
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
The Effects of Geometrical Scaling onFrequency Response and Noise Performance of Sige Hbts by
  • Zhang, S
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Spacer Patterning Technology for Nanoscale Cmos by
  • Choi, Y. -K
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
onSio2-Based Gate-Dielectric Scaling Limit for Low-Standby Power Applications InContext of A 0.13 Um Cmos Logic Technology by
  • Huang, T. H
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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