Qian, J Chang, C. W Chen, C. M <br/><br/>
Nondestructive Determination of Electromagnetic Parameters of Dielectric Materials At X-Band Frequencies Using A Waveguide Probe System. 

 - 1084-1092 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Calibration of Probe System<br/>X-Band Frequency