Chen, Linfeng ong, C. K <br/><br/>
Amendment of Cavity Perturbation Method  for  Permittivity Measruement of Extremely Low-Loss Dielectrics. 

 - 1031-1037 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Cavity Perturbation Method<br/>Complex Permittivity