Hamdioui, Said Goor, Ad  J. Van De <br/><br/>
Efficient Tests  for  Realistic Faults in Dual-Port Srams 

 - 460-473 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Multiport/Single-Port Memories<br/>Fault Models<br/>Weak Faults