TY  - SER
AU  - Venuto, D. De
AU  - Kayal, M.
AU  - Ohletz, M.J.
TI  - Fault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test
KW  - Quiescent Current
KW  - Silicon Wafer
KW  - Kink-Effect
ER  -