Venuto, D. De Kayal, M. Ohletz, M.J. <br/><br/>
Fault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test 

 - 387-398 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Quiescent Current<br/>Silicon Wafer<br/>Kink-Effect