TY  - SER
AU  - Kleveland, Bendik
AU  - Qi, Xiaoning
AU  - Madden, Liam
AU  - Furusawa, Takesfi
TI  - High-Frequency Characterization of on-Chip Digital Interconnects
KW  - High-Speed Integrated Circuits
KW  - Inductance Measurement
KW  - Integrated Circuit Interconnections
ER  -