Kleveland, Bendik Qi, Xiaoning Madden, Liam Furusawa, Takesfi <br/><br/>
High-Frequency Characterization of on-Chip Digital Interconnects 

 - 716-725 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>High-Speed Integrated Circuits<br/>Inductance Measurement<br/>Integrated Circuit Interconnections