TY  - SER
AU  - Huang, J.-T
AU  - Chen, T.P.
AU  - Tse, M.S.
TI  - Characterization of Interface Degradation in Deep Submicronmosfets By Gate Controlled -Diode Measurement
KW  - Mosfets
KW  - Gate-Controlled -Diode
KW  - Fowler
ER  -