TY  - SER
AU  - Koga, J
AU  - Takagi, S.-I
AU  - toriumi, A
TI  - Influences of Buried-Oxide Interface on Inversion-Layer Mobility in Ultrathin Soi Mosfets
KW  - Charge Carrier Mobility
KW  - Inversion Layers
KW  - Mosfets
ER  -