Lee, J. -S. <br/><br/>
A Study of Stress-Induced P+/N Salicided Junction Leakage Failure and Optimized Process Conditions  for  Sub-0.15-Um Cmos Technology 

 - 1985-1992 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Parkdale Develop Designer Fiber<br/>Young'S Modulus