Chandra, Anshuman Chakrabarty, Krishnendu <br/><br/>
Test Data Compression and Test Resource Partioning  for  System-on-A-Chip Using Frequency-Directed Run-Length (Fdr) Codes 

 - 1076-1088 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Automatic Test Equipment