Morvan, Erwan Sghaier, Nabil Souifi, Abdelkader <br/><br/>
Study of Trapping Phenomenon in 4h  Sic Mesfets Dependence on Substrate Purity 

 - 297-302 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Htcvd<br/>Trapping<br/>Mesfets