Larcher, Luca <br/><br/>
Statistical Simulation of Leakage Current in Mos and Flash Memory Devices with A New Multiphonon Trap-Assisted Tunneling 

 - 1246-1253 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Leakage Currents<br/>Flash Memories<br/>Modeling