Hastas, N A Tassis, D H Kamarinos, G <br/><br/>
Determination of Interface and Bulk Traps InSubthreshold Region of Polycrystalline Silicon Thin-Film Transistors 

 - 1991-1994 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Interface Traps<br/>Polysilicon