Sinencio, Edgar Sanchez Provost, Benoit <br/><br/>
on-Chip Ramp Generators  for  Mixed-Signal Bist and Adc Self-Test 

 - 263-273 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Linearity<br/>Time-Domain Test<br/>Ramp Generation