TY  - SER
AU  - Keezer, David C.
AU  - Patel, Chirag S.
AU  - Bakir, Muhannad S.
AU  - Zhou, Qing
TI  - Electrical Test Strategies  for  A Wafer-Level Packaging Technology
KW  - Interconnections
KW  - Packaging
KW  - Testing
ER  -