Cheong, Kuan Yew Dimitrijev, Sima <br/><br/>
Investigation of Ultralow Leakage in Mos Capacitors on 4h Sic 

 - 1371-1379 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nitrided Gate<br/>Nonvolatile<br/>Silicon Carbide