touhami, A Bouhdada, A <br/><br/>
Impact of Interface Traps on Gate-Induced Drain Leakage Current in N-Type Metal Oxide Semiconductor Field Effect Transistor 

 - 539-552 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mosfet<br/>Leakage Current<br/>Interface Traps