Bartoldus, R.W. Rutledge, R.A. Mikhail, W.F. <br/><br/>
The Reliability of Memory with  Single-Error Correction 

 - 560-564 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Error-Correcting Signature Code<br/>Fault-Tolerance<br/>Semiconductor Memories