Puri, Ruchir Chuang, Ching-Te <br/><br/>
Hyseresis Effect in Pass-Transistor-Based, Partialiy Depleted Soi Cmos Circuits 

 - 625-631 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuit Modeling<br/>Cmos Digital Integrated Circuits,<br/>Silicon-on-Insulator Technology