TY  - SER
AU  - Kolodzey, James
AU  - Chen, Shong-Chin
AU  - Olowolafe, Johnson Olufemi
TI  - Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon
KW  - Dielectric Breakdown
KW  - Semiconductor Dbr
KW  - Mos Capacitor
ER  -