Isaacson, Michael Betta, R. A. Dalia Soncini, G. <br/><br/>
onAccuracy of Generation lifetime Measurement in High-Resistivity Silicon Using Pn Gated Diodes 

 - 817-819 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Gated Diode<br/>Generation lifetime<br/>High-Reliability Organizations