Tsuno, Morikazu Tanaka, Masayasu Hirose, Masataka <br/><br/>
Physicaliy-Based Threshold Voltage Determination  for  Mosfet'S of Ali Gate Lengths 

 - 1429-1434 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability Loss<br/>Voltage Dip