Aflatooni, Koorosh Hornsey, Richard Nathan, Arokia <br/><br/>
Reverse Current Instabilities in Amorphous Silicon Schottky Diodes Modeling and Experiments 

 - 1417-1422 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Amorphous Silicon<br/>Carrier Transport Efficiency<br/>X-Ray Imaging