TY  - SER
AU  - Rodriguez, R.
AU  - Nafria, M.
AU  - Aymerich, X.
TI  - Trapped Charge Distributions in Thin (10nm) Sio2 Films Subected to Static and Dynamic Stresses
KW  - Charge Carrier Processes
KW  - Dielectric Breakdown
KW  - Oxide Degradation
ER  -