Rodriguez, R. Nafria, M. Aymerich, X. <br/><br/>
Trapped Charge Distributions in Thin (10nm) Sio2 Films Subected to Static and Dynamic Stresses 

 - 881-888 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Charge Carrier Processes<br/>Dielectric Breakdown<br/>Oxide Degradation