TY  - SER
AU  - Lou, Choon-Leong
AU  - Chin, Wai-Kin
AU  - Pan, Yang
TI  - A Novel Single-Device Dc Method  for  Extraction OfEffective Mobility and Source-Drain Resistances of Fresh and Hot -Carrier Degraded Drain-Resistances of Fresh and Hot-Carrier Degraded Drain-Engineered Mosfet'S
KW  - Hot Carrier
KW  - Mobility
KW  - Mosfet
ER  -