TY  - SER
AU  - Ricco, Bruno
AU  - Gozzi, Gianfranco
AU  - Lanzoni, Nassimo
TI  - Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films
KW  - Mos Capacitors
KW  - Reliability
KW  - Thin Oxide
ER  -