Ricco, Bruno Gozzi, Gianfranco Lanzoni, Nassimo <br/><br/>
Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films 

 - 1554-1560 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mos Capacitors<br/>Reliability<br/>Thin Oxide