TY  - SER
AU  - Shiue, Jao-Hsian
AU  - Lee, Joseph Ya-Min
AU  - Chao, Tien-Sheng
TI  - A Study of Interface Trap Generation by Fowler-Nordheim and Substrate-Hot-Carrier Stresses Fo 4-Nm Thick Gate Oxides
KW  - Hot Carrier
KW  - Interface Traps
KW  - Mos Device
ER  -