Gadelrab, Serag M. Chamberlain, Savvas G. <br/><br/>
Improvement OfReliability of Amorphous Silicon Transistors by Conduction-Band Tail Width Reduction 

 - 2179-2186 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Amorphous Silicon<br/>Amorphous Sitability<br/>Energy Band Tails