Banna, Srinivasa R. Chan, Philip C. H. Fung, Samuel K. H. <br/><br/>
A Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation 

 - 206-212 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Degradation<br/>Fuliy-Depleted Soi Mosfet<br/>Hot Carrier