Hess, Karl Lee, Jung-Ju Suh, Kwang-Pyuk <br/><br/>
An Alternative Interpretation of Hot Electron Interface Degradatio in Nmosfet'S Isotope Results Irreconcilable with  Major Defect Generation 

 - 1914-1916 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Cmos<br/>Deuterium<br/>Hot-Carrier