Wang, Tahui Chiang, Lu-Ping Zous, Nian-Kai <br/><br/>
A Comprehensive Study of Hot Carier Stress-Induced Drain Leakage Current Degradation in Thin-Oxide N-Mosfet'S 

 - 1877-1882 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Drain Leakge Degradation<br/>Hot Carrier<br/>Thin Oxide