TY  - SER
AU  - Schaneegans, Olivier
AU  - Boyer, lionel
AU  - Houze, Frederic
TI  - Study OfLocal Electrical Properties of Metal Surfaces Using an Afm with  a Conducting Probe
KW  - Atomic  for ce Microscopy
KW  - Conducting Polymer
KW  - Nanoconfinement
ER  -