Schaneegans, Olivier Boyer, lionel Houze, Frederic <br/><br/>
Study OfLocal Electrical Properties of Metal Surfaces Using an Afm with  a Conducting Probe 

 - 76-81 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic  for ce Microscopy<br/>Conducting Polymer<br/>Nanoconfinement